A paper written by Phase Focus technical staff and published in the peer-reviewed Journal of the Optical Society of America demonstrates a three-dimensional extension to the Company’s Phase Focus Virtual Lens® method.

The new approach requires no additional data collection, and it can be applied retrospectively to existing data. Unlike widely-used alternate 3D imaging methods such as tomography and confocal microscopy, there is no need to rotate the illuminating beam, or scan the specimen along the optical axis. A key benefit of the 3D Virtual Lens, also known as the “3D Ptychographical Iterative Engine”, is its application to thick specimens.

The authors envisage that the technique will have wide applications in many fields of microscopic structural discovery, and will be especially relevant to electron microscopy, where multiple scattering effects (called ‘dynamical’ effects in the electron literature) are endemic and seriously impair atomic-scale imaging. Link to: http://www.opticsinfobase.org/josaa/upcoming_pdf.cfm?id=164274