The Phase Focus Virtual Lens® product consists of the relevant algorithm (PIE; ePIE) embedded in an appropriate processing environment (e.g.: a PC with a graphics processing unit (GPU) card) and supplied with an application-specific graphical user-interface (GUI.)
Acquisition of diffraction patterns for input to the Phase Focus Virtual Lens® algorithm requires only a coherent light source (e.g.: diode laser); a means for moving the illumination with respect to the specimen; and a digital camera (e.g.: CCD.)
The processor-embedded Virtual Lens can form the basis of a “stand-alone” instrument, in which maximum design flexibility permits tailoring of product specifications to particular market needs.
The Phase Focus Virtual Lens® can also be integrated with existing instrumentation. In this case, the benefits of the Virtual Lens augment the full complement of existing conventional applications. For example, the Virtual Lens has here been integrated onto a conventional Olympus microscope platform.
Optionally, Virtual Lens data acquisition protocols may take advantage of existing conventional objective lenses, to integrate or compare the Virtual Lens with conventional techniques.
Because all image data are quantitative, they reflect properties inherent to the specimen rather than operator- or instrument-dependent factors. Thus, results are not dependent upon subjective operator interventions, and repeated experiments are highly consistent. This supports the integration of the Virtual Lens methodology into automated process work flows.
In a typical implementation, the GUI requires the user simply to define the required region of interest from a video feed scout scan, and then press “Start.” Images are displayed automatically in a variety of pre-selected types and formats, and can be exported in common file formats to third party applications.
