In collaboration with its academic partners and electron microscopy company Gatan, Inc., Phase Focus has published a peer-reviewed scientific paper that demonstrates the effectiveness of a method to improve the quality of Virtual Lens images.
The publication demonstrates the mitigation of illuminating beam positioning errors that are inherent to many types of host instrument into which the Company’s technology can be integrated. The new extensions to the Phase Focus Virtual Lens® technology – the “position-correcting Ptychographical Iterative Engine (pcPIE)” and “extended pcPIE (e-pcPIE)” – enable correction of beam positioning errors tens of times larger than the pixel size in the resulting image, as verified in visible light and electron microscopes. The primary applications will be in electron microscopy, where the difficulties of accurate control of the electron beam can now be mitigated; and in X-ray microscopy, where the difficulties in realising the positional accuracy of the specimen stages can now be mitigated, thereby supporting the goal of sub-10nm imaging. http://dx.doi.org/10.