Phase Focus will be exhibiting its unique Lens Profiler for Contact Lens Metrology, for the first time at BCLA 2012.
The Lens Profiler utilises the Phase Focus Virtual Lens®, which is a phase retrieval algorithm that measures how much the phase of an illuminating beam changes as it passes through the lens. This phase data is then used to map out thickness profiles with a lateral resolution of <7µm, and a thickness sensitivity of 50nm, oxygen transmissibility and power maps of contact lenses in their hydrated state.