Applications
The phase Focus Virtual Lens® eliminates the distortions, aberrations and performance limitations of conventional Microscopy instrumentation, and adds a new dimension of quantitative information.
Applicable in principle to the full electromagnetic spectrum as well as to electron and particle waves, it has already exceptional performance at visible light, x-ray and electron wavelengths.
This technology is being routinely used in applications ranging from Ophthalmic Metrology and Cell Imaging, to Metrology, Electron Microscopy and X-ray Microscopy.
